« All News

Junkosha Introduces New Metrology Grade mmWave VNA Test Cable Assembly

VNA Test Cable Assembly

Junkosha has launched a new metrology grade Microwave/mmWave VNA Test Cable Assembly. This new assembly is being showcased alongside the company’s innovative service options including the quickest lead times.

Accuracy is crucial in any test setting, but particularly so for metrology grade cabling, which offers ultimate precision and therefore demands the highest reliability for testing and calibration purposes. Utilizing Junkosha’s precision engineered-PTFE tape wrapping technology, the new cable exhibits excellent phase (within ± 4.5° at 50 GHz) and amplitude (within ± 0.08 dB at 50 GHz) stability in flexure alongside strong phase stability in temperature. The cable is flexible and can maintain this level of performance when bent 180° on a 2.25” radius mandrel, with no spring back. Able to reach 50 GHz and available with 2.4 mm connectors, the assembly also displays impressive performance durability – 50,000 tick-tock cycles is typical. The ruggedized port side NMD connector is also available to ensure reliable connections to the Vector Network Analyser (VNA).

“At Junkosha, we are constantly innovating new precision-engineered cabling solutions, not only for what is fast becoming a 5G enabled world, but also for specialised industries such as test and measurement,” explains Masaru Omoto, Product Manager for Junkosha. “Overall, the key application area for our new metrology grade Microwave/mmWave VNA test cable assembly is measuring the device under test (DUT) when designing a high-frequency component from scratch. In addition, our metrology grade cable will also be used for coaxial cable development, as well as cable products. Overall, target customers for this new solution include top-level national institutes, calibration laboratories and service providers where repeatability is key.”

Share News :
Shares 0

Recent Posts